Shibasoku will exhibit at “SEMICON Japan 2005” from December 7th.
ShibaSoku is honored to provide you a warm invitation to visit our booth at “SEMICON Japan 2005” held at the Japan Convention Center (The Makuhari Messe) for 3 days from Wednesday December 7th to Friday December 9th. We will be introducing a number of new products at our booth 11B-301 in Hall 11.
ShibaSoku will be introducing a new version of our S230 series PDP test system, the S230H. The success of the S230 series has established it as the de facto standard in the world for PDP data driver and scan driver ICs. The WL25 series, widely used for analog and power IC test applications, has also been updated to support massive parallel test to drive down the cost of test. In addition, ShibaSoku will exhibit the new WL27 series for mixed-signal LSI devices, the WS50 for double sided probe testing of power devices, and various mechatronics products.
We sincerely hope you will be able to take a few moments to drop by and see how we can dramatically improve your company’s test & measurement capabilities.
Takashi Shigezaki
President & C.E.O.
| Exhibition : |
December 7 (Wed) to 9 (Fri) |
| Location : |
Makuhari Messe, Chiba, Japan |
| Our Booth : |
Booth 11B-301, Hall 11 |
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Analog/Power IC Test System
WL25 series
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The WL25 uses multi DGS to support independent, parallel testing of high power devices. Its dual PC controller architecture assures repeatable and reliable production operation.
ShibaSoku will demonstrate parallel testing of 32 DUTs per station for dramatically improved cost of test.
The new WL25DP configuration will also be demonstrated with the WS50 probe system for dual side probe test of high-voltage & current power devices.
In addition, there will be a panel exhibition of connecting test system that domestic top share in connected results with laser trimmer system.
>More info |
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Mixed-Signal LSI Test System
WL27 series
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The WL27 series is designed to meet the high accuracy, high voltage, and high current demands of the semiconductor industry as power & automotive devices become more complex.
The new WL27H analog/mixed-signal LSI system configuration addresses these market demands on a production proven, extremely reliable platform.
In addition to the high voltage and high current option, the WL27H configuration supports up to 256 digital pins, 256 DC pins, and DSP source / measure options.
>More info |
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PDP Driver IC Test System
S230 series
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ShibaSoku will be introducing the new S230H configuration of the market leading S230 series PDP data driver and scan driver test system.
The S230H is capable of executing the full DC, digital, and timing test list at full voltage compliance for both scan and data driver ICs.
The S230H supports 512 independent driver channels for high speed parallel test. In addition, the S230 series had been integrated with TCP handlers, QFP handlers, and wafer probers. These integrated test cells have been proven in both probe and final test factories around the world.
>More info |
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Double Sided Wafer Prober
WS50
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The WS50 has the unique capability of probing both sides of a wafer simultaneously. This technique is rapidly becoming a requirement to fully test power devices at wafer probe.
Utilizing the WS50 dual side wafer prober allows semiconductor manufacturers to increase test coverage at wafer probe and reduce the costs associated with packaging and final test.
ShibaSoku will demonstrate the WS50 with the WL25 tester.
>More info |
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Terrestrial DTV Signal Generator
DS303A 
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The DS303A supports all of the work standards for DTV signals. It has been designed as a stand along bench top instrument and as an instrument which can easily be integrated into semiconductor test systems for production test of DTV ICs.
>More info
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