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 Based on a 125 MHz, 512 pin digital test system, the S310 supports ShibaSoku's traditional high-speed, high-accuracy, high pin count. A wide variety of analog and DC modules are installed. The S310 is an ideal mixed LSI test system for a wide variety of analog and digital devices. This test system achieves high-speed throughput and low cost due to its higher system-wide speed, integration, and lower noise.
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| Specifications |
| Test Rate: |
125/250 MHz |
| Perpin TG: |
512 I/O Pins |
| DSP Module |
| -AFG: |
16bits/10Msps |
| -ADGT: |
16bits/10Msps |
| -VFG: |
14bits/240Msps |
| -VDGT: |
14bits/80Msps
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| Target Applications |
| CDMA/W-CDMA/CODEC/PHS/Bluetooth/Wireless LAN/PDC/DVD/CD-ROM/Digital Audio/Video |
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 This is a new model in the WL27 mixed logic/power LSI test system, for use with high pin count. It is ideal for the parallel testing of mixed A/D power devices, such as automotive application. TheWL27 is best solution mixed tester offering high-speed throughput and superior cost performance.
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| Specifications |
| Test Rate: |
20/40 MHz |
| Digital Pins: |
256 Pins,256 PPS (WL27H),
128 Pins,128 PPS (WL27) |
| DSP Module |
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| - AFG: |
16bits/10Msps |
| - ADGT: |
16bits/10Msp |
| - VFG: |
14bits/240Msps |
| - VDGT: |
14bits/80Msps |
High Power V/I source; +/-60 V, +/-10 A can be installed
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| Target Applications |
Motor Drs./MCU/Composite Reg./System LSIs/Automotive Devices
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