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 The WL25 uses multi DGS to support total parallel testing of power devices. It provides a wide variety of V/I variations. The newly-developed high-speed BUS that shorten hardware setting times and the lower system noise combine to offer high-accuracy testing.
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| Specifications |
| Perpin DC: |
512pins |
| V/I source: |
+/-50V, +/-250mA
+/-128V, +/-250mA (+/-40V,+/-2A) |
| High Power V/I source: |
+/-60V, +/-10A
+/-30V, +/-30A(floating power supply) |
| High Voltage V/I source: |
+800V/-500V, +/-200mA
+2000V, +20mA |
| Function: |
5MHz Test Rate,Correspond to 64 Digital
DSP Module can be installed |
| Parallel testing: |
16DUTs/ST
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| Target Applications |
| Reg./IPD/Analog & Power (has a wide range of uses, from small amplitude signals to power-LSI and power-MOS) |
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 This is a newly-developed compact version of the WL25. It can measure between one and four small amplitude signal linear devices in parallel, and is ideal for mass-production tests. All the modules used are compatible with the WL25.
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| Specifications |
| Perpin DC: |
32pins |
| V/I source: |
+/-50V, +/-250 mA
+/-128V, +/-250mA (+/-40V, +/-2A) |
| Parallel testing: |
4DUTs/ST
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| Target Applications |
| Reg./IPD/Analog & Power (has a wide range of uses, from small amplitude signals to power-LSI and power-MOS) |
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