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 This is an LSI test system which support multi-testing. It achieves a high throughput, the fastest in the industry. It is also designed to be low-cost and space-saving. The S210 is more than a simple logic tester, as when optional modules are added, the system can be used in a wide variety of applications such as1 BIT-DAC audio analog tests.
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| Specifications |
| Test Rate: |
20/40MHz |
| Perpin TG: |
512 I/O Pins |
| Parallel testing: |
32DUTs/ST
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| Target Applications |
| DVD/CD-RW/CD-ROM/PHS/MCU/LCD-Dr/LTPS/SYSTEM LSI |
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 The S230 test system has been specially designed for testing PDP (Plasma display) driver devices and has been a de fact standard in the PDP Driver testing market. This system can be used to test both data driver and high voltage scan driver device testing.
It can be connected to all types of probers and handlers, for tests such as Wafer Probe tests, TCP Tests and QFP Tests.
The S230H also supports a high-speed interface for RSDS or high-speed clocks, which have attracted attention recently.
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| Specifications |
| Test Rate: |
20/40/60 MHz |
| Perpin TG: |
64 I/O,512 HV Pins |
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Correspond to RSDS I/F |
| Parallel testing: |
4DUTs/ST |
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Correspond to high-speed comparator |
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High-accuracy Tr/Tf measurement possible |
| Option: |
HS-CLK,OLED
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| Target Applications |
| PDP Driver ICs (Data, Scan) |
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