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 The S230 test system has been specially designed for testing PDP (Plasma display) driver devices and has been a de fact standard in the PDP Driver testing market. This system can be used to test both data driver and high voltage scan driver device testing.
It can be connected to all types of probers and handlers, for tests such as Wafer Probe tests, TCP Tests and QFP Tests.
The S230H also supports a high-speed interface for RSDS or high-speed clocks, which have attracted attention recently.
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| Specifications |
| Test Rate: |
20/40/60 MHz |
| Perpin TG: |
64 I/O,512 HV Pins |
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Correspond to RSDS I/F |
| Parallel testing: |
4DUTs/ST |
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Correspond to high-speed comparator |
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High-accuracy Tr/Tf measurement possible |
| Option: |
HS-CLK,OLED
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| Target Applications |
| PDP Driver ICs (Data, Scan) |
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