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Large Current Power Semiconductor Test System
WL25MV Multi-Stage Hi-Voltage/Large Current Test System : Shibasoku
Target Application IGBT/MOSFET Module or Chip
WL25MV Example Test Sequence (4 Test Stages)
Capability of 8 Multi-Stage (AC/DC Stage)
Central Control to Test Data (Multi Production Window)
Stable Production Circumstance
Built-in the over current protection allows to block a damage from Dynamic Test.