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Large Current Power Semiconductor Test System
WL25v+WS58V Power Semiconductor Wafer Test System : Shibasoku
Target Application IGBT, MOSFET, FRD, SBD
Along with WS58V Double Sided Prober, WL25V allows a precision AC&DC probing testing for the large current power semiconductors. The combination of WL25V and WS58V could save R&D investment cost and make a test time reduction.
WL25v+WS58V Power Semiconductor Wafer Test System
Ex) System Specification
          2000V/200A
±64V/±160mA
±16V/±200A
+2000V/±20mA
500ps 4ch DSP
Over Current Protection
 
The protection circuit has held a patent by Shibasoku.

(patent publication number 4558601)
Ex) Test Item on Wafer level
Hi-Temp. 175˚C
Thickness 60um
Vth (200A)
RON (2mΩ)
Qg
Avalanche
VF