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 This is a new model in the WL27 mixed logic/power LSI test system, for use with high pin count. It is ideal for the parallel testing of mixed A/D power devices, such as automotive application. TheWL27 is best solution mixed tester offering high-speed throughput and superior cost performance.
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| Specifications |
| Test Rate: |
20/40 MHz |
| Digital Pins: |
256 Pins,256 PPS (WL27H),
128 Pins,128 PPS (WL27) |
| DSP Module |
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| - AFG: |
16bits/10Msps |
| - ADGT: |
16bits/10Msp |
| - VFG: |
14bits/240Msps |
| - VDGT: |
14bits/80Msps |
High Power V/I source; +/-60 V, +/-10 A can be installed
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| Target Applications |
Motor Drs./MCU/Composite Reg./System LSIs/Automotive Devices
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