SEMICON JAPAN VIRTUAL Exhibition notice
Thank you very much for your continuous support. We would like to express deeply sorry to all those affected and their families by COVID-19. SEMICON JAPAN 2020 will be exhibited using Virtual due to influence of COVID-19. ShibaSoku would like to introduce our New Test system "WL-EXceed" that we have developed and Any test solutions for Power devise that meet diversified needs in the future. Besides, we have prepared video and document data of ShibaSoku products. We are very appreciate if you take the opportunity to visit ShibaSoku's booth.
SEMICON Japan VIRTUAL HP
Virtual Exhibition - December 14 to 17
On demand - December 11 to January 15
Introduction of Exhibits
- WL-EXceed Analog & Power Mixed Test System WL-EXceed is brand new Test system which has innovative with new architecture for next generation.
- Static and dynamic Test system ShibaSoku propose this Test system for all Power devices such as IGBT, MOSFET and Diode.
- Burn-In Test System This is a burn-in system for Automotive (2in1 to 7in1).
- Avalanche Low-current Test system Avalanche Low-current Test system is for dynamic test (Screening) on the Wafer test process.
- New business ShibaSoku can support the Space business using ShibaSoku's measurement technology.
WL-EXceed can propose significant improvement on customer's production line and high operability
for both beginners and experts engineer.
Also we can provide test solution for all process such as Wafer level test, Chip test, Packages test and Modules test.
It can be used on production combination with Handler machine.
It has "High-speed protection circuit" which can protect Damage of wafer.
We also can cooperate for many kind of development support such as Circuit design, Trial products and Evaluation.
We are looking forward to your visit.