Semiconductor test system

Mixed signal LSI test system

【Target devices】Automotive, Power supply, Battery management, Each drivers, etc

Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system. This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.

【WL27/WL27H】

Specifications highlight
  Detection 
Test Rate: 20/40 MHz
Digital Pins: 256 pins、256 PPS (WL27H)
128 pins、128 PPS (WL27)
DSP Module AFG: 16 bits/10 Msps
DSP Module ADGT: 16 bits/10 Msps
DSP Module VFG: 14 bits/240 Msps
DSP Module VDGT: 14 bits/80 Msps
High Power V/I: ±60 V/±10 A mountable
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