Mixed signal LSI test system
【Target devices】Automotive, Power supply, Battery management, Each drivers, etc
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system. This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
|Test Rate:||20/40 MHz|
|Digital Pins:||256 pins、256 PPS (WL27H)|
|128 pins、128 PPS (WL27)|
|DSP Module AFG:||16 bits/10 Msps|
|DSP Module ADGT:||16 bits/10 Msps|
|DSP Module VFG:||14 bits/240 Msps|
|DSP Module VDGT:||14 bits/80 Msps|
|High Power V/I:||±60 V/±10 A mountable|
WL27Prime Mixed Signal LSI Test-System
Our New product WL27Prime make it possible to testing various products which is Power-Mixed IC build in MCU, LSI with 100MHz and other.
- Providing I/O Digital as Maximum1024ch
- Parallel Test : Maximum 128 DUT
- Mounting Multi-Patter Generator, SCAN and ALPG
- Providing PMU, TMU function as Per-pin
- Customer can choose various modules for WL25 series on WL27Prime.
- Power device testing can be possible by High-Current, High-Voltage option.
- 100MHz 1024 I/O Digital